MCP-S330 Low Resistivity Mapping System
Variations of thickness and composition conductive films. metals, Metallic thin films, etc. are clear at a glance.
Capable of mapping samples up to 300 mm sq. and continuous measurement of multiple sheets of samples.
Uses:
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Production engineering
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Quality Control
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R&D
Features
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Measurable from 10-4Ω to 107Ω range in connection with Loresta GX.
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Full automation: Measurement, Arithmetic, Data processing, and 3D graph output.
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Sample sizes up to 300mm sq. and multiple sheets of sample is also measurable.
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Coordinate data can also be imported from an external source besides three types of measurement position sets: grid input, line input, and sequential input.
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Comparator function that marks the measurement point on the screen where the measurement result is out of the specified range.