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MCP-S330 Low Resistivity Mapping System

  • Description

MCP-S330 Low Resistivity Mapping System 

Variations of thickness and composition conductive films. metals, Metallic thin films, etc. are clear at a glance.


Capable of mapping samples up to 300 mm sq. and continuous measurement of multiple sheets of samples.

Uses:

  • Production engineering

  • Quality Control

  • R&D

 

Features

  • Measurable from 10-4Ω to 107Ω range in connection with Loresta GX.

  • Full automation: Measurement, Arithmetic, Data processing, and 3D graph output.

  • Sample sizes up to 300mm sq. and multiple sheets of sample is also measurable.

  • Coordinate data can also be imported from an external source besides three types of measurement position sets: grid input, line input, and sequential input.

  • Comparator function that marks the measurement point on the screen where the measurement result is out of the specified range.

 
Contact us
  • DKSH Australia Pty. Ltd.
  • 1 Beyer Road
  • Braeside VIC 3195
  • Australia

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